This paper investigates the electroelastic interaction between a dislocation
and collinear interfacial rigid lines in two dissimilar piezoelectric materials
subjected to remote loadings. Both conducting and dielectric rigid lines
are considered. The general solutions for the field variables are obtained
based on the Stroh formalism and analytical function theory. The stress and
electric displacement fields at the tips of rigid conducting lines are present as
either a square root singularity or a combination of any two of the three
kinds of singularities: square root singularity, nonsquare root singularity
and oscillatory singularity. The stress and electric displacement fields at
the tips of rigid dielectric lines exhibit either a square root singularity or a
combination of square root and oscillatory singularities. Singularities depend on the
electroelastic properties of the two piezoelectric materials. The rigid line extension
force is expressed in terms of the strain and electric field intensity factors
which are analogous to the stress and electric displacement intensity factors
defined for interfacial cracks. The exact field solutions for the case of a single
interfacial rigid line are presented. The tangential and radial components of
the image force on the dislocation are calculated. Numerical examples are
presented to demonstrate the effects of some important parameters on the image
force.
Keywords
piezoelectric, bimaterials, dislocation, rigid lines,
interface, energy release rate, image force