A theoretical study is conducted on an orthotropic solid with a nanodefect (e.g.,
inclusion, hole, or crack) under far-field antiplane shear loading. A rigorous analytical
solution of the stress fields is presented using the Gurtin–Murdoch surface/interface
model and a conformal mapping technique. Several new and existing solutions are
considered for the special and degenerated cases. The major results of the study are
as follows:
Interface stresses are greatly dependent on size when the size of a defect
is at the nanometer scale, and the interface stresses approach the classical
elasticity results when a defect has large characteristic dimensions.
The interface effect of a nanodefect decreases with an increase in defect
section aspect ratio.
When the modulus of the defect (inclusion) increases, the interface effect
decreases, i.e., the interface effect can be neglected when the inclusion is
sufficiently hard.
Keywords
orthotropic materials, nanodefects, interface stresses,
antiplane shear, Gurtin–Murdoch surface/interface model