|
|||||
 |
|
|
|
|
|
|
|
Integrated
modelling of tool wear and microstructural evolution internal
relations in friction stir welding with worn pin profiles
Zhao Zhang and Zhijun Tan |
|
Vol. 14 (2019), No. 4, 537–548
|
Abstract |
|
An adaptive remeshing model was coupled with the Archard equation to calculate the tool wear in friction stir welding (FSW). The Monte Carlo method was used to simulate recrystallization in FSW with worn tools. In addition, experiments were used to validate the predicted temperatures and microstructures. As indicated by the results, appropriate tool wear can lead to self-optimization of the tool in FSW. This wear mechanism is controlled by the change in the average strain rate during the FSW process. The average strain rate first increases and then decreases with tool wear, which is the key factor when determining the final grains. An appropriate amount of tool wear can lead to smaller grains in the stirring zone of FSW whereas excess tool wear can lead to larger grains. |
PDF Access Denied
We have not been able to recognize your IP address
44.220.251.236
as that of a subscriber to this journal.
Online access to the content of recent issues is by
subscription, or purchase of single articles.
Please contact your institution's librarian suggesting a subscription, for example by using our journal-recommendation form. Or, visit our subscription page for instructions on purchasing a subscription.
You may also contact us at
contact@msp.org
or by using our
contact form.
Or, you may purchase this single article for USD 45.00:
Keywords
friction stir welding, wear, Monte Carlo
|
Milestones
Received: 2 March 2019
Revised: 30 July 2019
Accepted: 15 August 2019
Published: 13 December 2019
|
Authors |
| Zhao Zhang | |
| Department of Engineering
Mechanics Dalian University of Technology No. 2 Linggong Road % Dalian 116024, China Dalian, 116024 China |
|
| Zhijun Tan | |
| Department of Engineering
Mechanics Dalian University of Technology No. 2 Linggong Road % Dalian 116024, China Dalian, 116024 China |
|
