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Evolution of crystalline thin films by evaporation and condensation in three dimensions

Paolo Piovano and Francesco Sapio

Vol. 14 (2026), No. 4, 441–471
Abstract

The morphology of crystalline thin films evolving on flat rigid substrates by condensation of extra film atoms or by evaporation of their own atoms in the surrounding vapor is studied in the framework of the theory of stress driven rearrangement instabilities (SDRI). By following the literature both the elastic contributions due to the mismatch between the film and the substrate lattices at their theoretical (free-standing) elastic equilibrium, and a curvature perturbative regularization preventing the problem to be ill-posed due to the otherwise exhibited backward parabolicity, are added in the evolution equation. The resulting Cauchy problem under investigation consists of an anisotropic mean-curvature type flow of the fourth-order on the film profiles, which are assumed to be parametrizable as graphs of functions measuring the film thicknesses, coupled with a quasistatic elastic problem in the film bulks. The existence of a regular solution for a finite period of time is established under periodic boundary conditions by means of employing minimizing movements to exploit the gradient-flow structure of the evolution equation.

Keywords
thin films, evaporation, condensation, mismatch strain, gradient flow, curvature regularization, minimizing movements
Mathematical Subject Classification
Primary: 35M13, 35Q74
Milestones
Received: 30 March 2025
Revised: 21 April 2026
Accepted: 2 June 2026
Published: 7 September 2026

Communicated by Francesco dell'Isola
Authors
Paolo Piovano
Dipartimento di Matematica
Politecnico di Milano
Milano
Italy
Francesco Sapio
Wolfgang Pauli Institute
Vienna
Austria